Bibliografía de Microscopía Electrónica y Microanálisis

A Guide to Scanning Microscope Observation
Jeol Ltd.

Electron Microscopy, Principles and Techniques for Biologists
John J. Bozzola, Lonnie D. Russell
1992. Jones and Bartlett Publishers. Boston, USA.

Energy-Dispersive X-Ray Microanalysis: An Introduction.
Kevex Corporation. Foster City, California, USA.

Image analysis, Enhancement and Interpretation
Practical Methods in Electron Microscopy - Volumen 7
D. L. Misell
1990. North-Holland Publishing Company. Amsterdam.

Instruction Manual for Model HU 11C1 Electron Microscope
1963. Hitachi, Ltd. Tokyo, Japan.

Introduction to the Scanning Electron Microscope. Theory, Practice & Procedures.
Prepared by Michael Dunlap and Dr. J. E. Adaskaveg.
1997. Presented by the Facility for Advanced Instrumentation, U. C. Davis.

Microscopía Electrónica
Cecil E. Hall
1970. Ediciones Urmo. Bilbao, España.

Operation Manual for Jeol JSM-6460LV Electron Microscope.
2004. Jeol. Japan.

Optica. Fundamentos de Física - Volumen III
Francis W. Sears
1971. Aguilar. Madrid, España.

Principios y práctica de la Microscopía Electrónica
Viviana S. de Lozano, Alfonsina Morales, María Julia Yáñez
2014. Bahía Blanca, República Argentina. 
http://www.bahiablanca-conicet.gob.ar/biblioteca/
principios-practica-microscopia-electronica.pdf

Principles and Practice of Electron Microscope Operation
Practical Methods in Electron Microscopy - Volumen 2
Alan W. Agar, Ronald H. Alderson, Dawn Chescoe.
1991. North-Holland Publishing Company. Amsterdam.

Principles and Techniques of Electron Microscopy. Biological Applications.
M. A. Hayat
1989. CRC Press, Inc. Boca Raton, Florida, USA.

Practical Scanning Electron Microscopy
Joseph I. Goldstein, Harvey Yakowitz
1975. Plenum Press. New York, USA.

Sample Preparation. A guide to ideal sample preparation.
Phenom-World BV
2017. Eindhoven, The Netherlands.

Sample Preparation Handbook for Transmission Electron Microscopy 
Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Daniele Laub
2010. Springer Science+Business Media, LLC, 233 Spring Street, New York, NY 10013, USA.

Scanning Electron Microscope A to Z. Basic Knowledge for using the SEM. 
2015. Jeol Ltd. Tokio, Japan.
http://www.jeol.co.jp/en/applications/
pdf/sm/sem_atoz_all.pdf

Transmission Electron Microscopy. Physics of Image Formation. 
Ludwig Reimer, Helmut Kohl
Springer Series in Optical Sciences. 
2008. Springer Science+Business Media, LLC, 233 Spring Street, New York, NY 10013, USA.

Transmission Electron Microscopy. A Textbook for Materials Science. 
David B. Williams, C. Barry Carter
2009. Springer Science+Business Media, LLC, 233 Spring Street, New York, NY 10013, USA.