EMLAB --Laboratorio de Microscopía Electrónica

Curso de Posgrado
Introducción a la Microscopía Electrónica


Presentación

Programa

Cronograma

Bibliografía


Documentos


Encuesta a alumnos


Laboratorio de
Microscopía Electrónica

 

 

 

Bibliografía

A Guide to Scanning Microscope Observation **
Jeol Ltd.

Electron Microscopy, Principles and Techniques for Biologists
John J. Bozzola, Lonnie D. Russell
1992. Jones and Bartlett Publishers. Boston, USA.

Energy-Dispersive X-Ray Microanalysis: An Introduction.
Kevex Corporation. Foster City, California, USA.

Introduction to the Scanning Electron Microscope. Theory, Practice & Procedures. **
Prepared by Michael Dunlap and Dr. J. E. Adaskaveg.
1997. Presented by the Facility for Advanced Instrumentation, U. C. Davis.

Microscopía Electrónica **
Cecil E. Hall
1970. Ediciones Urmo. Bilbao, España.

Optica. Fundamentos de Física - Volumen III
Francis W. Sears
1971. Aguilar. Madrid, España.

Principios y práctica de la Microscopía Electrónica **
Viviana S. de Lozano, Alfonsina Morales, María Julia Yáñez
2014. Bahía Blanca, República Argentina. 
http://www.bahiablanca-conicet.gob.ar/biblioteca/principios-practica-microscopia-electronica.pdf

Principles and Practice of Electron Microscope Operation
Practical Methods in Electron Microscopy - Volumen 2
Alan W. Agar, Ronald H. Alderson, Dawn Chescoe.
1991. North-Holland Publishing Company. Amsterdam.

Practical Scanning Electron Microscopy
Joseph I. Goldstein, Harvey Yakowitz
1975. Plenum Press. New York, USA.

Sample Preparation. A guide to ideal sample preparation. **
Phenom-World BV
2017. Eindhoven, The Netherlands.

Sample Preparation Handbook for Transmission Electron Microscopy 
Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Daniele Laub
2010. Springer Science+Business Media, LLC, 233 Spring Street, New York, NY 10013, USA.

Scanning Electron Microscope A to Z. Basic Knowledge for using the SEM. **
2015. Jeol Ltd. Tokio, Japan.
http://www.jeol.co.jp/en/applications/pdf/sm/sem_atoz_all.pdf

Transmission Electron Microscopy. Physics of Image Formation. **
Ludwig Reimer, Helmut Kohl
Springer Series in Optical Sciences. 
2008. Springer Science+Business Media, LLC, 233 Spring Street, New York, NY 10013, USA.

Transmission Electron Microscopy. A Textbook for Materials Science. **
David B. Williams, C. Barry Carter
2009. Springer Science+Business Media, LLC, 233 Spring Street, New York, NY 10013, USA.

 

** Disponibles en versión electrónica (pdf). Ir a Documentos